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Journal Articles

A New method for measuring secondary electron emission yield from Nd surface bombarded by ions from a laser-ion source

Tamura, Koji; Ogura, Koichi; Shibata, Takemasa

Japanese Journal of Applied Physics, Part 1, 37(9A), p.5005 - 5007, 1998/09

https://doi.org/10.1143/JJAP.37.5005

Times Cited Count：6 Percentile：32.53(Physics, Applied)

no abstracts in English